Microscopy in Semiconductor Failure Analysis: Techniques, Tools, and Best Practices
Jan 16th 2026
Semiconductor failure analysis plays a critical role in ensuring device reliability, improving yield, and reducing costly production defects. As semiconductor designs become smaller, denser, and more complex, microscopy has become one of the most essential tools for identifying, isolating, and understanding failure mechanisms at the micro- and nanoscale.
This guide explores how microscopy is used
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