Semiconductor Inspection Microscopes

The Fein Optic M50-12 NIR wafer microscope has NIR objectives and a motorized stage. Objective Lenses : Includes the following Infinity Corrected Plan Semi Apochromat NIR lenses: Plan Semi Apo NIR 5x, NA = 0.15, WD = 19.5mm Plan Semi Apo NIR 10x, NA =...

The Fein Optic M50-12 NIR wafer microscope has NIR objectives and a manual stage. Objective Lenses: Includes the following Infinity Corrected Plan Semi Apochromat NIR lenses: Plan Semi Apo NIR 5x, NA = 0.15, WD = 19.5mm Plan Semi Apo NIR 10x, NA = 0...

The Fein Optic M50-12 advanced semiconductor microscope is tailored for demanding inspection, metrology, and analysis of Semiconductor and MEMS devices in the wafer fabrication plant. Providing observation in brightfield, darkfield, polarization, and DIC...

The Fein Optic M68 advanced semiconductor microscope is tailored for demanding inspection, metrology, and analysis of Semiconductor and MEMS devices in the wafer fabrication process. Providing observation in brightfield, darkfield, polarization, and DIC...

The Fein Optic M48 semiconductor wafer inspection microscope provides brightfield, darkfield, reflected, and transmitted light. It features a sturdy all metal frame and long travel mechanical stage that accommodates 8" semiconductor wafers, slices, and...

The Fein Optic M46 metallurgical microscope is designed for semiconductor wafer inspection. This inspection microscope provides brightfield and darkfield, transmitted, and reflected light microscopy and a 6" stage. Objective Lenses: Infinity...

This Fein Optic M68 critical dimension semiconductor microscope system has been designed for measurement of critical dimensions of semiconductors. The microscope system includes a PAXcam X5 camera equipped with PAX-it! Basic Measurement, PAX-it! Image...

The Fein Optic M50-12 advanced semiconductor microscope is tailored for demanding inspection, metrology, and analysis of Semiconductor and MEMS devices in the wafer fabrication plant. Providing observation in brightfield, darkfield, polarization, and DIC...

The Fein Optic M68 advanced semiconductor microscope is tailored for demanding inspection, metrology, and analysis of Semiconductor and MEMS devices in the wafer fabrication process. Providing observation in brightfield, darkfield, polarization, and DIC...

This digital high resolution probe station provides sub 1µm resolution and features a 20 megapixel camera with software for capturing images. Features a long working distance lens system with quad turret.  Lens System: Long working...

This digital high resolution probe station provides resolution down to 1µm and a 20 megapixel camera with software for capturing images.  Lens System: Long working distance lens with coaxial illumination port and built in 1x C-mount...

This digital probe station provides 141x - 990x magnification if using a 22" monitor. Magnification varies based on monitor size. The system provides 1µm of resolution and a 20 megapixel digital camera with software for capturing images. Navitar...