WDI Wise Device Inc. NIR Laser Scanning Confocal Microscopes

WDI's IRLC and LSCM systems employ a near-infrared (NIR) laser, specialized infrared optics, and confocal imaging technology. They provide the ability to acquire clear, high resolution images from deep within silicon and other similar materials.

WDI's NIR laser scanning confocal microscopes are optimized for imaging through silicon and doped substrates. These systems allow non-destructive interior and subsurface inspection of silicon devices and wafers resulting in imaging of internal structures at sub-micron resolution.

The IRLC systems come as a complete automation package including motorized XY stage, six position nosepiece, illumination, focus and Z-Position, and intuitive software with laser attenuation. The LSCM systems can be configured as fully automated, semi-automated, or manual versions.

View images captured with the NIR Laser Scanning Confocal Microscope.

View the NIR Laser Scanning Confocal Microscopes brochure.

NOTE: This is a special order item and is not returnable.